掺杂剂
材料科学
薄膜晶体管
铟
兴奋剂
氧化物
光电子学
水溶液
氧气
薄膜
化学工程
纳米技术
图层(电子)
冶金
化学
有机化学
工程类
作者
Wangying Xu,Tao Peng,Shuangmu Zhuo,Qiubao Lin,Weicheng Huang,Yujia Li,Fang Xu,Chun Zhao,Deliang Zhu
标识
DOI:10.3390/ijms232112912
摘要
Solution-grown indium oxide (In2O3) based thin-film transistors (TFTs) hold good prospects for emerging advanced electronics due to their excellent mobility, prominent transparency, and possibility of low-cost and scalable manufacturing; however, pristine In2O3 TFTs suffer from poor switching characteristics due to intrinsic oxygen-vacancy-related defects and require external doping. According to Shanmugam’s theory, among potential dopants, phosphorus (P) has a large dopant–oxygen bonding strength (EM-O) and high Lewis acid strength (L) that would suppress oxygen-vacancy related defects and mitigate dopant-induced carrier scattering; however, P-doped In2O3 (IPO) TFTs have not yet been demonstrated. Here, we report aqueous solution-grown crystalline IPO TFTs for the first time. It is suggested that the incorporation of P could effectively inhibit oxygen-vacancy-related defects while maintaining high mobility. This work experimentally demonstrates that dopant with high EM-O and L is promising for emerging oxide TFTs.
科研通智能强力驱动
Strongly Powered by AbleSci AI