原子探针
原子单位
表征(材料科学)
场离子显微镜
图像分辨率
领域(数学)
材料科学
离子
Atom(片上系统)
工作(物理)
计算物理学
光学
纳米技术
计算机科学
物理
数学
量子力学
透射电子显微镜
嵌入式系统
纯数学
作者
Baptiste Gault,Benjamin Klaes,Felipe F. Morgado,Christoph Freysoldt,Yue Li,Frédéric De Geuser,Leigh T. Stephenson,F. Vurpillot
标识
DOI:10.1017/s1431927621012952
摘要
Atom probe tomography is often introduced as providing "atomic-scale" mapping of the composition of materials and as such is often exploited to analyse atomic neighbourhoods within a material. Yet quantifying the actual spatial performance of the technique in a general case remains challenging, as they depend on the material system being investigated as well as on the specimen's geometry. Here, by using comparisons with field-ion microscopy experiments and field-ion imaging and field evaporation simulations, we provide the basis for a critical reflection on the spatial performance of atom probe tomography in the analysis of pure metals, low alloyed systems and concentrated solid solutions (i.e. akin to high-entropy alloys). The spatial resolution imposes strong limitations on the possible interpretation of measured atomic neighbourhoods, and directional neighbourhood analyses restricted to the depth are expected to be more robust. We hope this work gets the community to reflect on its practices, in the same way, it got us to reflect on our work.
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