Strain‐Releasing in Tableted Perovskite Wafer for Large‐Area Computed Tomography Imaging

ABSTRACT The high performance of solution‐processed perovskite X‐ray detectors has significantly enhanced their potential applications in computed tomography (CT) imaging. However, achieving large‐area and hundreds of micrometers‐thick perovskite films with uniform charge transport performance remains challenging due to limitations in material uniformity and residual strain accumulation. Here we present a novel combination of fast‐tableting technique and solvent annealing process to fabricate large‐area detectors with improved material homogeneity and reduced intrinsic strain. Optimized perovskite detectors achieve a record‐low noise equivalent dose (NED) of 45 pGy and a high detective quantum efficiency (DQE) of 80%, enabling low‐dose, high‐contrast imaging with excellent single‐photon sensitivity across a broad energy range. This work highlights the critical role of released intrinsic strain in constructing high‐quality and large‐area perovskite wafers, capable of seamlessly stitching images across an area of 2.4 × 7.2 cm 2 for CT imaging. These advancements underscore the potential for high‐resolution and large‐area CT imaging applications.