材料科学
纳米
透射电子显微镜
纳米结构
制作
纳米技术
分辨率(逻辑)
常规透射电子显微镜
高分辨率透射电子显微镜
电子显微镜
显微镜
传输(电信)
光电子学
光学
扫描透射电子显微镜
复合材料
物理
医学
替代医学
电气工程
工程类
病理
人工智能
计算机科学
作者
Jingmin Zhang,Liping You,Hengqiang Ye,Dapeng Yu
出处
期刊:Nanotechnology
[IOP Publishing]
日期:2007-04-18
卷期号:18 (15): 155303-155303
被引量:29
标识
DOI:10.1088/0957-4484/18/15/155303
摘要
Highly ordered ultrafine nanostructures (feature size <10 nm) have been successfully fabricated with single-nanometre precision using a convergent electron beam (CEB) in a high-resolution transmission electron microscope (HRTEM). This approach can be widely applied to inorganic solid-state materials including insulators, semiconductors and metals. The feature size can be precisely controlled by the probe size and the irradiation time. The formation mechanism of nanostructures fabricated by CEB has been discussed in terms of knock-on damage and the beam heating effect. On the basis of the experimental results of electron energy-loss spectroscopy (EELS), finite element thermal analysis reveals that the heating effect of the high-energy electron beam is negligible in inorganic solid-state materials, and the sculpting of nanostructures is predominated by the knock-on damage or ionization of high-energy electrons.
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