The analysis and evaluation of chip scale package (CSP) solder joint reliability
作者
HongZhen Yang,Xinyu Cao
出处
期刊:International Conference on Electrical and Control Engineering日期:2011-09-01卷期号:: 1315-1318
标识
DOI:10.1109/iceceng.2011.6057842
摘要
Analysis using ANSYS software, CSP component was reduced to two-dimensional model. In the thermal cyclic loading conditions using finite element simulating the stress and strain distribution of CSP components, obtained a dangerous solder joint of structural failure. The number of failure cycles about dangerous solder joint was predicted. Finally, introduced several analysis and evaluation method for the CSP solder joint reliability evaluation.