The research on breakdown voltage of high voltage SOI LDMOS devices with shielding trench
作者
Qiyu Liu,Zhaoji Li,Bo Zhang,Jian Fang
标识
DOI:10.1109/icsict.2001.981446
摘要
A novel structure of the high voltage SOI LDMOS with the shielding trench and its breakdown mechanism are proposed, which largely increases in the breakdown voltage of the high voltage SOI devices. The breakdown voltage more than 2000 V of the SOI LDMOS is obtained by the optimization.