Micro X-ray fluorescence reveals pore space details and spatially-resolved porosity of rock-based microfluidic devices

pressure gradients. This study designed and carried out a porosity mapping protocol using model and real-rock microfluidic devices and contrast fluids. Etched silicon micromodels with real-rock pore network patterns served as ideal models to establish a proof of concept. Measurements were performed on a novel μXRF microscope not powered by synchrotron radiation. We registered the μXRF datasets with the binary rock masks used for micromodel fabrication and applied segmentation algorithms to compare porosities. We assessed expected advantages and limitations through a sensitivity analysis and beam study. μXRF is an important new imaging technique for microfluidic applications.