21‐1: Quantifying Localized Trap Evolution in Blue TADF OLED

Thermally activated delayed fluorescent (TADF) emitters attract interest as organic light‐emitting diode (OLED) materials with potentially 100% internal quantum efficiency (IQE). Their application in commercial displays is still hindered due to the not yet sufficient operational stability. We analyze the degradation mechanism in a TADF OLED by combining electro‐optical characterization and device simulations. We find that two trap states are being created at the HTL/EML interface during initial degradation.