薄脆饼
紫外线
光电子学
氮化物
材料科学
比例(比率)
紫外线
纳米技术
物理
图层(电子)
量子力学
作者
Fujun Xu,Jiaming Wang,Ji Chen,Jing Lang,Lisheng Zhang,X. N. Kang,Zhixin Qin,Xuelin Yang,Ning Tang,Xinqiang Wang,Weikun Ge,Bo Shen
出处
期刊:Research Square - Research Square
日期:2024-06-06
标识
DOI:10.21203/rs.3.rs-4527364/v1
摘要
Abstract A ground-breaking roadmap of III-nitride solid-state deep-ultraviolet (DUV) light emitters is demonstrated to realize the wafer-scale fabrication of devices in vertical injection configuration, from 2 to 4 inches, and expectably larger. The epitaxial device structure is stacked on a GaN template instead of conventionally adopted AlN, where the primary concernof the tensile strain for Al-rich AlGaN on GaN is addressed via an innovative decoupling strategy, making the device structure decoupled from the underlying GaN template. Moreover, the strategy provides a protection cushion against the stress mutation during the removal of substrates. As such, large-sized DUV light-emitting diode (LED) wafers can be obtained without surface cracks, even after the removal of the sapphire substrates by laser lifted-off. Wafer-scale fabrication of 280 nm vertical injection DUV-LEDs is eventually exhibited, where a light output power of 65.2 mW is achieved at a current of 200 mA, largely thanks to the significant improvement of light extraction. This work will definitely speed up the application of III-nitride solid-state DUV light emitters featuring high performance and scalability.
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