电容器
电解电容器
降级(电信)
可靠性(半导体)
薄膜电容器
滤波电容器
可靠性工程
计算机科学
电子工程
材料科学
功率(物理)
工程类
电气工程
电压
物理
量子力学
作者
Anunay Gupta,Om Prakash Yadav,Douglas DeVoto,Joshua Major
出处
期刊:U.S. Department of Energy Office of Scientific and Technical Information - OSTI OAI
日期:2018-08-27
被引量:81
标识
DOI:10.1115/ipack2018-8262
摘要
This paper firstly reviews the failure causes, modes and mechanisms of two major types of capacitors used in power electronic systems — metallized film capacitors and electrolytic capacitors. The degradation modeling related to these capacitors is then presented. Both physics-of-failure and data-driven degradation models for reliability and lifetime estimation are discussed. Based on the exhaustive literature review on degradation modeling of capacitors, we provide a critical assessment and future research directions.
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