材料科学
原子单位
纳米技术
扫描透射电子显微镜
纳米尺度
压电
工程物理
比例(比率)
电子
透射电子显微镜
复合材料
物理
量子力学
作者
Haijun Wu,Xiaoxu Zhao,Cao Guan,Li‐Dong Zhao,Jiagang Wu,Dongsheng Song,Changjian Li,John Wang,Kian Ping Loh,T. Venkatesan,Stephen J. Pennycook
标识
DOI:10.1002/adma.201802402
摘要
Abstract Defects in crystalline materials have a tremendous impact on their functional behavior. Controlling and tuning of these imperfections can lead to marked improvements in their physical, electrical, magnetic, and optical properties. Thanks to the development of aberration‐corrected (scanning) transmission electron microscopy (STEM/TEM), direct visualization of defects at multiple length scales has now become possible, including those critically important defects at the atomic scale. Thorough understanding of the nature and dynamics of these defects is the key to unraveling the fundamental origins of structure–property relationships. Such insight can therefore allow the creation of new materials with desired properties through appropriate defect engineering. Herein, several examples of new insights obtained from representative functional materials are shown, including piezoelectrics/ferroelectrics, oxide interfaces, thermoelectrics, electrocatalysts, and 2D materials.
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