衍射
电子背散射衍射
电子断层摄影术
结晶学
选区衍射
低温电子层析成像
粉末衍射
反射高能电子衍射
衍射层析成像
作者
Ute Kolb,Yaşar Krysiak,Sergi Plana-Ruiz
出处
期刊:Acta Crystallographica Section B Structural Crystallography and Crystal Chemistry
日期:2019-08-01
卷期号:75 (4): 463-474
被引量:15
标识
DOI:10.1107/s2052520619006711
摘要
Electron diffraction tomography (EDT) has gained increasing interest, starting with the development of automated electron diffraction tomography (ADT) which enables the collection of three-dimensional electron diffraction data from nano-sized crystals suitable for ab initio structure analysis. A basic description of the ADT method, nowadays recognized as a reliable and established method, as well as its special features and general applicability to different transmission electron microscopes is provided. In addition, the usability of ADT for crystal structure analysis of single nano-sized crystals with and without special crystallographic features, such as twinning, modulations and disorder is demonstrated.
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