101‐4: A Study on the Anti‐Electrostatic Field Performance of AMOLED Modules

Based on customer complaints and user feedback from the market, electrostatic failures in AMOLED mobile display modules have evolved from early hard ESD damage to soft failures induced by frictional electrostatic fields, with symptoms such as green tint and green flickering. This paper begins by analyzing the failure scenarios and subsequently develops two testing approaches: one involving electrostatic friction testing that closely simulates real‐world user failure conditions, and another utilizing a high‐voltage direct current electric field test for rapid excitation. The latter method proves instrumental in enhancing the anti‐electrostatic field performance of OLED modules. Furthermore, the failure mechanism is investigated by examining the charge transfer pathways within the module under electrostatic fields, the endogenous electric field in the polyimide (PI) layer, and its impact on the electrical characteristics of the TFT back channel, specifically the threshold voltage (Vth) and subthreshold swing (SS.). Finally, based on the failure mechanism analysis, countermeasures are proposed, including the implementation of BSM shielding in the display panel, optimization of three‐layer film properties, adjustment of the BPF (Back Plate film), increased impedance of the PI layer, and process improvements in module manufacturing.