A General Static Random Access Memory Testing Method and Its Application

Abstract To ensure the complete success of the satellite launch mission, components used in the aerospace field must undergo strict functional performance verification. In traditional testing methods, ATE (Automated Test Equipment) based testing methods are time-consuming, costly and have low fault coverage. The scanning based testing method has high testing costs, long testing cycles, and poor portability, making it unsuitable for the current development needs of large capacity, high-speed, and low-power memory. The built-in-self-test has a low fault coverage due to limited testing procedures. The article proposes a universal verification method for components based on FPGA (Field Programmable Gate Array) and MCU (Microcontroller Unit), which not only effectively verifies components, but also greatly reduces testing costs, solving the shortcomings of long testing cycles, high costs, difficulty in automatic control, and data analysis and processing for components. The system hardware consists of a universal verification motherboard and a functional verification daughter board, while the software consists of upper compute software, embedded software, and FPGA software. This method has successfully verified the performance and functionality of various types of storage chips, with strong universality and flexibility, achieving good verification results and ensuring the quality and reliability of domestic chips.