锌黄锡矿
钝化
材料科学
从头算
分子动力学
化学物理
载流子寿命
分子轨道
半导体
Atom(片上系统)
重组
分子物理学
计算化学
硅
纳米技术
光电子学
太阳能电池
分子
图层(电子)
化学
捷克先令
生物化学
有机化学
计算机科学
基因
嵌入式系统
作者
Huiwen Xiang,Zhenfa Zheng,Ke Zhao,Chengyan Liu,Jin Zhao
标识
DOI:10.1002/adfm.202407991
摘要
Abstract Nonradiative recombination at the front contact interface of kesterite solar cells hinders the extraction of photo‐generated carriers, significantly restricting the efficiency enhancement. However, identifying the recombination centers and proposing effective passivation strategies remain open questions. First‐principles calculations combining with nonadiabatic molecular dynamics (NAMD) simulations unveil that the interfacial translational symmetry breaking in elemental valence states leads to a detrimental donor‐like Cu 2 ZnSnS 4 /CdS interface with deep states originating from the interfacial Sn‐5s orbital, which serve as significant nonradiative recombination centers. Here, two mechanisms are proposed for eliminating the deep interface states: 1) directly replacing Sn‐5s with higher outer orbital levels by substituting group IIIA elements (In and Ga) for the interfacial Sn atom; 2) introducing an extra defect‐level coupling with Sn‐5s by substituting group VA elements (N, P, and As) for the S atoms bonded with the interfacial Sn atom. The representative In Sn and P S acceptor defects, which are energetically favorable at the detrimental donor‐like interface, effectively passivate the deep interface states, markedly improving the carrier lifetimes by weakening nonadiabatic coupling between the band edge and the interfacial states. This study reveals the origin of the interfacial nonradiative recombination of kesterite solar cells and offers insights into interfacial passivation in semiconductor devices.
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