化学气相沉积
薄脆饼
材料科学
半导体器件制造
过程(计算)
过程控制
扩散
统计过程控制
工艺工程
纳米技术
计算机科学
工程类
物理
热力学
操作系统
作者
Satyajit Shinde,Chee Huei Chan,Marcus David Minchew,Lawrence Mbonu
标识
DOI:10.1109/asmc49169.2020.9185301
摘要
Nitride film LPCVD (Low Pressure Chemical Vapor Deposition) process is well known in semiconductor industry. The paper covers an innovative approach in touching two aspects of improvement in LPCVD nitride process in diffusion furnace. First is the extension of quartz life use by implementation of unique LTP (Low Temperature Purge) without affecting particle performance. Secondly, the impact of extended quartz life on the wafer uniformity across the different zones and methodology to compensate it.
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