可追溯性
计量学
校准
计算机科学
系统工程
可靠性工程
计算机断层摄影术
任务(项目管理)
测量不确定度
质量(理念)
工程类
数学
物理
软件工程
医学
统计
量子力学
放射科
作者
Wim Dewulf,Harald Bosse,Simone Carmignato,Richard Leach
出处
期刊:CIRP Annals
[Elsevier]
日期:2022-01-01
卷期号:71 (2): 693-716
被引量:11
标识
DOI:10.1016/j.cirp.2022.05.001
摘要
X-ray computed tomography (XCT) is increasingly being used for evaluating quality and conformance of complex products, including assemblies and additively manufactured parts. The metrological performance and traceability of XCT nevertheless remains an important research area that is reviewed in this paper. The error sources influencing XCT measurement results are discussed, along with related qualification, calibration and optimization procedures. Moreover, progress on performance verification testing and on the determination of task-specific measurement uncertainty is covered. Results of interlaboratory comparisons are summarized and performance in various dimensional measurement fields is illustrated. Conclusions and an outlook for future research activities are also provided.
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