过电位
钝化
电化学
电解质
硅
材料科学
石英
分析化学(期刊)
溶解
无机化学
化学工程
化学
电极
物理化学
冶金
图层(电子)
纳米技术
工程类
色谱法
作者
Wei Xiao,Xianbo Jin,Yuan Deng,Dihua Wang,Xiaohong Hu,George Z. Chen
出处
期刊:ChemPhysChem
[Wiley]
日期:2006-06-30
卷期号:7 (8): 1750-1758
被引量:160
标识
DOI:10.1002/cphc.200600149
摘要
The electrochemical reduction of solid SiO2 (quartz) to Si is studied in molten CaCl2 at 1173 K. Experimental observations are compared and agree well with a novel penetration model in relation with electrochemistry at the dynamic conductor|insulator|electrolyte three-phase interlines. The findings show that the reduction of a cylindrical quartz pellet at certain potentials is mainly determined by the diffusion of the O(2-) ions and also the ohmic polarisation in the reduction-generated porous silicon layer. The reduction rate increases with the overpotential to a maximum after which the process is retarded, most likely due to precipitation of CaO in the reaction region (cathodic passivation). Data are reported on the reduction rate, current efficiency and energy consumption during the electroreduction of quartz under potentiostatic conditions. These theoretical and experimental findings form the basis for an in-depth discussion on the optimisation of the electroreduction method for the production of silicon.
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