显微镜
光学切片
光学
薄层荧光显微镜
荧光显微镜
时间分辨率
材料科学
光学显微镜
双光子激发显微术
荧光
分辨率(逻辑)
光激活定位显微镜
干涉测量
超分辨显微术
荧光寿命成像显微镜
图像分辨率
显微镜
物理
扫描电子显微镜
计算机科学
人工智能
作者
Keisuke Isobe,Takanori Takeda,Kyohei Mochizuki,Qiyuan Song,Akira Suda,Fumihiko Kannari,Hiroyuki Kawano,Akiko Kumagai,Atsushi Miyawaki,Katsumi Midorikawa
摘要
We demonstrate super-resolution imaging with background fluorescence rejection by interferometric temporal focusing microscopy, in which temporal focusing is combined with structured illumination. The lateral resolution and the optical sectioning capability are simultaneously improved by factors of 1.6 and 1.4, respectively, compared to conventional temporal focusing microscopy. Fluorescent beads (200 nm diameter) that are difficult to distinguish from the background fluorescence in conventional temporal focusing microscopy, are clearly visualized by interferometric temporal focusing microscopy.
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