原子单位
扫描透射电子显微镜
化学成像
分辨率(逻辑)
能量(信号处理)
材料科学
电子能量损失谱
电子
物理
原子物理学
透射电子显微镜
纳米技术
计算机科学
量子力学
人工智能
高光谱成像
作者
Michel Bosman,Vicki J. Keast,J. L. Garcı́a-Muñoz,A.J. D’Alfonso,Scott D. Findlay,Leslie J. Allen
标识
DOI:10.1103/physrevlett.99.086102
摘要
The simultaneous measurement of structural and chemical information at the atomic scale provides fundamental insights into the connection between form and function in materials science and nanotechnology. We demonstrate structural and chemical mapping in ${\mathrm{Bi}}_{0.5}{\mathrm{Sr}}_{0.5}{\mathrm{MnO}}_{3}$ using an aberration-corrected scanning transmission electron microscope. Two-dimensional mapping is made possible by an adapted method for fast acquisition of electron energy-loss spectra. The experimental data are supported by simulations, which help to explain the less intuitive features.
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