X射线光电子能谱
材料科学
俄歇电子能谱
烧结
退火(玻璃)
冶金
扫描电子显微镜
渗氮
分析化学(期刊)
真空炉
氮气
化学工程
复合材料
化学
有机化学
图层(电子)
核物理学
工程类
物理
色谱法
作者
Henrik Borgström,Lars Nyborg
标识
DOI:10.1179/174329006x98353
摘要
In the present study the authors have used X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES) to assess how surface oxides limit the gas nitriding depth of gas atomised M4 high speed steel powder and compacts. Scanning electron microscopy (SEM) and X-ray diffraction (XRD) have been used for phase identification. In model experiments XPS and AES analyses of vacuum annealed powder were performed in an interconnected furnace, limiting reoxidation. Sintering cycles with and without vacuum annealing treatment were also evaluated. Generally, the authors found that an increased vacuum annealing treatment time decreased the amount of residual oxygen, which improved densification. AES and XPS analyses of the model experiments showed that the vacuum annealing time increased the absorption of nitrogen. In the sintered compacts, SEM, AES and XRD analysis as well as Thermo–Calc simulations showed that similar amounts of nitrogen were tied to vanadium carbonitrides. An AES comparison between the model and sintering experiments showed that the nitrogen absorption had the Sieverts’ law dependence once the surface oxide had been removed.
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