符号                        
                
                                
                        
                            电介质                        
                
                                
                        
                            材料科学                        
                
                                
                        
                            分析化学(期刊)                        
                
                                
                        
                            电气工程                        
                
                                
                        
                            物理                        
                
                                
                        
                            数学                        
                
                                
                        
                            光电子学                        
                
                                
                        
                            有机化学                        
                
                                
                        
                            化学                        
                
                                
                        
                            工程类                        
                
                                
                        
                            算术                        
                
                        
                    
            作者
            
                Mukuljeet Singh Mehrolia,Dharmendra Kumar,Ankit Verma,Abhishek Kumar Singh            
         
                    
        
    
            
            标识
            
                                    DOI:10.1109/ted.2023.3336301
                                    
                                
                                 
         
        
                
            摘要
            
            The article examines the low-voltage organic thin film transistor’s (OTFTs) manufacturing and characterization process for hydrogen sulfide (H  $_{\text{2}}$  S) gas sensing at room temperature and could be helpful at various emanating sites. The fabrication methodology utilizes a cost-efficient solution processed spin coating method for high-  $\textit{k}$  dielectric (SrZrO  $_{\text{x}}$  ) as a gate oxide and floating film transfer method (FTM) for silver nanoparticles doped PBTTT-C14 film for the active semiconductor layer. The developed spin-coated dielectric film offers a high capacitance of 433 nF/cm  $^{\text{2}}$  with a high band gap of 4.95 eV. and also offers 0.1 nA/cm  $^{\text{2}}$  leakage current density, which clarifies that the dielectric film has very less numbers of pin holes suitable for good-performing OTFT. The surface morphology of the dielectric film shows a very smooth dielectric film (rms roughness 0.245 nm), which demonstrates a high-quality dielectric/semiconductor interface offered by the dielectric film for the high performance of the device. On the other hand, the low-cost FTM deposited silver nanoparticles doped PBTTT-C14 active layer film is quite uniform (30  $\pm$  3 nm thickness) and free from any anisotropic effect, which further improves the device performance for sensing applications. The developed sensor is deliberately characterized for H  $_{\text{2}}$  S gas sensor shows a sensing response of 80% at 5 ppm. The sensor passes with a low detection limit of 15.17 ppb and exhibits a relative shift of 47.7% over 5 ppm H  $_{\text{2}}$  S gas in threshold voltage. The developed device can be used in various gas emanating sites and oil industries.
         
            
 
                 
                
                    
                    科研通智能强力驱动
Strongly Powered by AbleSci AI