Uniformity of Electrical Parameters on MCT Epitaxy Film

For Hall measurement under different magnetic fields at LN_2 temperature,Hg_(1-x)Cd_xTe (MCT) film (radius 1 cm) grown on CdTe substrate by LPE is photoengraved into many small Van Der Pauw squares,then their Hall coefficients and mobilities are measured and analyzed,respectively.Two films were Hall-tested during the temperature range from LHe 4.2 K to about 200 K.An actual impression on the uniformity of electrical parameters for MCT film can obtained by means of the methods presented in this paper.