光电子学
材料科学
宽禁带半导体
肖特基二极管
二极管
氮化镓
肖特基势垒
金属半导体结
纳米技术
图层(电子)
作者
Shu Yang,Shaowen Han,Rui Li,Kuang Sheng
标识
DOI:10.1109/ispsd.2018.8393655
摘要
In this paper, we present vertical GaN Schottky barrier diodes implemented on bulk GaN substrates, delivering a breakdown voltage of ~1 kV, a specific ON-resistance of 1.3 mΩ·cm 2 with current spreading considered, a high current swing over 13 orders of magnitude and a low ideality factor of 1.04. The developed devices exhibit current-collapse-free operation under 400 V/500 ns switching condition as well as zero reverse recovery characteristics, showing great potential for high-power and high-frequency applications.
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