硅
外延
半导体
光电子学
异质结
纳米技术
半导体器件
化合物半导体
化学
结晶度
材料科学
晶体管
碲化镉光电
半导体材料
场效应晶体管
工程物理
混合硅激光器
单晶硅
宽禁带半导体
晶体硅
电子迁移率
晶体生长
作者
Tingkai Feng,Ye Li,Chengyuan Xue,Duo Xu,W. Sun,X. Gao,Xuzhong Cong,Wanqing Liu,Boyang Fu,Yuefeng Nie,Congwei Tan,Hailin Peng
摘要
Integrating single-crystalline two-dimensional (2D) semiconductors onto silicon is critical to achieving the convergence of 2D materials with silicon (Si) lines. Compared with transfer, direct growth of 2D semiconductors on silicon offers benefits such as process compatibility with mainstream Si technology and the ability to form clean and uniform heterointerfaces. However, the direct growth of single-crystal 2D semiconductors on silicon is usually challenged by weak interfacial interactions and uncontrolled chemical reactions. Herein, we demonstrate an epitaxial integration strategy to grow single-crystalline 2D semiconductors on a Si (100). Through introducing a SrTiO3 buffer layer, which mitigates detrimental side reactions and offers excellent lattice match, successful coherent epitaxy of a single-crystal Bi2O2Se film on silicon has been achieved. The as-synthesized Bi2O2Se film exhibits outstanding single crystallinity and uniformity on a centimeter scale. Furthermore, transistors fabricated on 2D Bi2O2Se revealed a high field-effect mobility of up to ∼230 cm2 V-1 s-1. Our work provided a superior strategy for scalable preparation of high-quality 2D semiconductors on industrialized Si substrates.
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