显微镜
共焦
共焦显微镜
光学
图像质量
图像分辨率
显微镜
分辨率(逻辑)
直线(几何图形)
材料科学
薄层荧光显微镜
荧光显微镜
计算机视觉
计算机科学
荧光
人工智能
扫描共焦电子显微镜
图像(数学)
物理
数学
几何学
作者
Venkataraman Krishnaswami,Giulia M. R. De Luca,Ronald M. P. Breedijk,Cornelis J.F. Van Noorden,Erik M. M. Manders,Ron A. Hoebe
摘要
Fluorescence microscopy is an important tool in biomedical imaging. An inherent trade-off lies between image quality and photodamage. Recently, we have introduced rescan confocal microscopy (RCM) that improves the lateral resolution of a confocal microscope down to 170 nm. Previously, we have demonstrated that with controlled-light exposure microscopy, spatial control of illumination reduces photodamage without compromising image quality. Here, we show that the combination of these two techniques leads to high resolution imaging with reduced photodamage without compromising image quality. Implementation of spatially-controlled illumination was carried out in RCM using a line scanning-based approach. Illumination is spatially-controlled for every line during imaging with the help of a prediction algorithm that estimates the spatial profile of the fluorescent specimen. The estimation is based on the information available from previously acquired line images. As a proof-of-principle, we show images of N1E-115 neuroblastoma cells, obtained by this new setup with reduced illumination dose, improved resolution and without compromising image quality.
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