纳米尺度
润湿
材料科学
表面光洁度
表面粗糙度
接触角
比例(比率)
纳米技术
机械
曲面(拓扑)
航程(航空)
复合材料
物理
几何学
数学
量子力学
作者
Tsu-Hsu Yen,Chyi‐Yeou Soong
出处
期刊:Physical review
[American Physical Society]
日期:2016-02-25
卷期号:93 (2)
被引量:26
标识
DOI:10.1103/physreve.93.022805
摘要
Several models have been developed to predict the contact angle of a droplet sitting on a roughened surface; however, no such model has been developed for substrates with nanoscale surface structures. In this paper we propose a hybrid Cassie-Wenzel model, which considers two factors attributed to the breakdown of macroscopic predictions, including the width of the wall-fluid depletion region and the coexistence of Cassie and Wenzel states in cases where the wall-fluid interface presents nanoscale structures. At the molecular scale, the parameter of surface roughness can be corrected by treating the wall-fluid interface as a hybrid Cassie-Wenzel state in which the fraction in the Wenzel state depends on fluid density within the cavities. A more general model developed using data fitted to fluid density is able to account for deviating tendencies induced by nanoscale surface features. A comparison of predicted results obtained in this study with those from previous works demonstrates that the proposed hybrid Cassie-Wenzel model is applicable to the evaluation of wettability in a wide range of substrates with nanoscale surface structures, corresponding to a Cassie state, a Wenzel state, and a mixed state. More importantly, the present work provides a quantitative approach to the estimation of wettability even amidst nanoscale effects, which can have a significant influence in cases with surface features at the molecular scale.
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