背板
薄膜晶体管
平板显示器
可靠性(半导体)
过程(计算)
晶体管
依赖关系(UML)
材料科学
计算机科学
电子工程
光电子学
电气工程
工程类
计算机硬件
纳米技术
人工智能
图层(电子)
电压
量子力学
操作系统
物理
功率(物理)
作者
Daeyoun Cho,Jiho Moon,T.-Y. Kihm,Yoonseuk Choi,Jongwoo Park
摘要
This paper details the low temperature poly‐crystalline silicon oxide (LTPO) thin‐film transistor (TFT) technology development primarily focused on image sticking (IS) and recovery behaviors, the backplane process optimization, which is painstaking multi‐faceted approach from TFT to panel to circuit, in order to ensure display performance and reliability. Palpable understanding on light induced IS and recovery, the dependency of bias layout design and backplane process integration are crucial.
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