纳米压痕
材料科学
变形(气象学)
断裂(地质)
碲化物
范德瓦尔斯力
基质(水族馆)
复合材料
纳米技术
光电子学
冶金
地质学
分子
有机化学
化学
海洋学
作者
Yan Zhou,Shi Zhou,Penghua Ying,Qinghua Zhao,Yong Xie,Mingming Gong,Pisu Jiang,Hui Cai,Bin Chen,Sefaattin Tongay,Jin Zhang,Wanqi Jie,Tao Wang,Ping‐Heng Tan,Dong Liu,Martin Kuball
标识
DOI:10.1021/acs.jpclett.2c00411
摘要
The deformation and fracture mechanism of two-dimensional (2D) materials are still unclear and not thoroughly investigated. Given this, mechanical properties and mechanisms are explored on example of gallium telluride (GaTe), a promising 2D semiconductor with an ultrahigh photoresponsivity and a high flexibility. Hereby, the mechanical properties of both substrate-supported and suspended GaTe multilayers were investigated through Berkovich-tip nanoindentation instead of the commonly used AFM-based nanoindentation method. An unusual concurrence of multiple pop-in and load-drop events in loading curve was observed. Theoretical calculations unveiled this concurrence originating from the interlayer-sliding mediated layers-by-layers fracture mechanism in GaTe multilayers. The van der Waals force dominated interlayer interactions between GaTe and substrates was revealed much stronger than that between GaTe interlayers, resulting in the easy sliding and fracture of multilayers within GaTe. This work introduces new insights into the deformation and fracture of GaTe and other 2D materials in flexible electronics applications.
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