Combining wave-optical and ray-tracing calculations in x-ray reflective optical systems

Coherent or partially coherent X-rays have recently been utilized in beamlines at advanced synchrotron radiation facilities and X-ray free-electron lasers. Wave-optical and ray-tracing calculations are widely employed to predict intensity and phase distributions of X-ray beams when designing new beamlines. Both calculation methods have their respective advantages and disadvantages. In this presentation, we will compare the results of calculations in optical systems that use X-ray focusing mirrors, and introduce a method for combining these two methods. Furthermore, we will discuss the applications of this method for calculating partially coherent X-rays.