Contribution of Lattice Defects to the Intensity of Quasi-Forbidden X-ray Reflections of Diamond: Comparison of X-Ray Topography and Infrared Spectroscopy Data

New developments of application of X-ray topography in the quasi-forbidden (222) reflection from perfect crystals with diamond lattice to investigate defects are presented. The spatial distribution of intensities of (111) and (222) X-ray reflections is correlated with the distribution of point defects in synthetic diamonds of various types. It is shown that X-ray topography in the quasi-forbidden (222) reflection is a promising tool for investigation of weak stress fields in perfect crystals.