加速度计
验证质量
微电子机械系统
绝缘体上的硅
表面微加工
材料科学
体微机械加工
灵敏度(控制系统)
电容感应
干涉测量
加速度
光电子学
光学
电子工程
制作
硅
计算机科学
电气工程
工程类
物理
医学
替代医学
病理
经典力学
操作系统
作者
Ziqiang Qu,Huafeng Liu,H. Daniel Ou‐Yang,Chenyuan Hu,Liangcheng Tu
出处
期刊:IEEE Sensors
日期:2020-10-25
卷期号:: 1-4
被引量:11
标识
DOI:10.1109/sensors47125.2020.9278761
摘要
High-sensitivity micro-electromechanical systems (MEMS) accelerometers have been widely used in many applications. Although the optical MEMS accelerometers have the advantage of insensitive to electromagnetic interferences, there are still difficulties of integration and fabrication. Therefore, capacitive MEMS accelerometers are more commonly used. This paper introduces a high-sensitivity optical MEMS accelerometer based on silicon-on-insulator (SOI) double-side micromachining technology which can overcome the difficulties of both optical component integration and low-frequency suspension system micromachining. The proposed sensor is a silicon flexure accelerometer whose spring-mass structure consists of the compliant spring beams, the proof mass and the sensor frame. When acceleration applies, the in-plane motion of the proof mass can be transduced by an optical interferometer with the Fabry-Perot (F-P) cavity formed between the fiber end-face and the proof mass sidewall. The sensitivity of the micro-machined optical accelerometer is measured as 100 ng/√Hz@1 Hz which is better than most of the reported optical MEMS accelerometers.
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