Structural and Electrical Characterization of Cadmium Sulphide Thin Films Prepared by Chemical Bath Deposition Method

CdS films were prepared by chemical bath deposition (CBD) method at 800C. The crystallographic structure and size of the crystallites in the thin film were studied by x-ray diffraction on unannealed and samples annealed at 150 0C and 250 0C. The crystallite size was found to increase upon annealing. The resistivity measurements were studied by using four probe methods for both annealed and unanneled samples showed that the resistivity decreases upon annealing. Thus both structural and electrical properties should that the particles size increases and the resistivity decreases upon annealing. Key words: Thin Films, Cadmium Sulphide.