Complementary thermoreflectance and micro-Raman analysis of facet temperatures of diode lasers

A methodological approach for advanced facet temperature characterization of operating diode lasers is presented. It relies on the concerted application of micro-Raman spectroscopy and thermoreflectance mapping. The latter technique allows for fast facet mapping, whereas the Raman data provide the temperature calibration. Residual effects, e.g., caused by the different reflectances of the materials involved into the laser structure, are discussed. Since both techniques provide rather complementary information, their concerted application appears as an effective tool for advanced device inspection.