化学计量学
降级(电信)
氢
光致发光
材料科学
等离子体
分析化学(期刊)
基质(水族馆)
磷
光电子学
化学
环境化学
物理化学
电子工程
冶金
工程类
地质学
有机化学
物理
海洋学
量子力学
作者
R. J. Schutz,Kazunobu Matsushita,H.L. Hartnagel,J. Y. Longère,Stanisław Krawczyk
出处
期刊:Electronics Letters
[Institution of Engineering and Technology]
日期:1990-04-26
卷期号:26 (9): 564-566
被引量:23
摘要
It is demonstrated that the degradation of InP substrates in a hydrogen plasma can be prevented by the introduction of phosphorus vapour into the reaction chamber. The results obtained, using standard surface analysis techniques and photoluminescence depth profiling, indicate that the stoichiometry of the InP surface region can be preserved and the number of P-vacancies which diffuse into the bulk drastically reduced.
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