材料科学
退火(玻璃)
扫描电子显微镜
薄膜
拉曼光谱
衍射
光电子学
开路电压
太阳能电池
短路
薄膜太阳能电池
分析化学(期刊)
电压
纳米技术
复合材料
光学
化学
电气工程
物理
工程类
色谱法
作者
Xiaobo Hu,Jiahua Tao,Shiming Chen,Juanjuan Xue,Guoen Weng,Kaijiang,Zhigao Hu,Jinchun Jiang,Shaoqiang Chen,Z. Q. Zhu,Junhao Chu
标识
DOI:10.1016/j.solmat.2018.08.006
摘要
Sb2Se3 thin films prepared by vapor transport deposition (VTD) method have been treated by post annealing process at 200 °C in vacuum condition for 1 h, and the comparative studies between the post annealing treatment (PAT) and without the treatment were carried out. The device efficiency was improved from 4.89% to 5.72% by PAT via the augment of open-circuit voltage and fill factor. Electrical properties from dark J-V and C-V measurements, structural properties from X-ray diffraction, Raman and scanning electron microscope measurements, defect properties from admittance measurements have been compared for the two cell samples. The Sb2Se3 cell sample with PAT was found to own less parallel current pathways, larger built-in voltage, better crystalline and lower defects densities, which may account for the efficiency enhancement.
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