Static Power Consumption in Nano-CMOS Circuits: Physics and Modelling
作者
W. Kuźmicz,E. Piwowarska,Andrzej Pfitzner,Dominik Kasprowicz
出处
期刊:International Conference Mixed Design of Integrated Circuits and Systems日期:2007-06-01卷期号:: 163-168被引量:14
标识
DOI:10.1109/mixdes.2007.4286142
摘要
Static power consumption due to excessive leakage currents is a major problem in CMOS digital ICs with gate lengths of 90 nm and below. In this paper the physics and modelling of these currents is discussed, with special emphasis on variability and its effect on the statistical spread of the static power consumption and total power consumption.