Issues in the Validation of Wholesale Credit Risk Models
作者
Jonathan Jones,Debashish Sarkar
出处
期刊:Cambridge University Press eBooks [Cambridge University Press] 日期:2023-02-28卷期号:: 232-262
标识
DOI:10.1017/9781108608602.011
摘要
This chapter examines wholesale credit risk models and their validation at US banking institutions. The most common practice in wholesale credit risk modeling for loss estimation among large US banking institutions today is to use expected loss models, typically at the loan level. The chapter discusses the quantification and validation of three key risk parameters in this modeling approach, namely, probability of default (PD), loss given default (LGD), and exposure at default (EAD).