P‐4.2: De‐Mura Processing Integrated in Display Drivers for AMOLED Display

High‐performance Mura artifact reduction (De‐Mura) processing is developed and integrated in display drivers for raising panel yield. The proposed De‐Mura processing, designed to compensate an active‐matrix organic light‐emitting diode (AMOLED) panel's luminance Mura (L‐Mura) and color Mura (C‐Mura), shows excellent display performance, and the major display properties include a diminished luminance nonuniformity from about 50% to about 10% under different gray levels, and an improved visually imperceptible color nonuniformity. Among 500 pieces of 5.83” (1128×2436, 460 PPI) retina AMOLED panels, panel yield is improved up to 96.8%. Our works reveals an effective external De‐Mura solution integrated in display drivers for panel factories and module suppliers to obtain high panel yield.