Electron and ion temperature measurement with a new x-ray imaging crystal spectrometer on WEST

A new x-ray imaging crystal spectrometer (XICS) has been installed, aligned, and used during experimental campaigns on the WEST tokamak. It has three interchangeable crystals for measuring the Ar XVII, Ar XVIII, and Fe XXV spectra, respectively. A patented rotating table holding the crystals is used to monitor the crystal facing the plasma remotely and without changing the position of the camera. Here, the focus is made on the Ar XVII spectrum, between 3.93 and 4.00 Å. The design of the diagnostic is presented, and a synthetic diagnostic, implemented with the Python library ToFu, is used to show the instrument’s operational performance and limits. The instrument function exhibits the following two main features: a distortion for the Ar XVII spectrum, presumably due to the crystal manufacturing in two parts, and the measurement of three W spectral lines on the Ar XVI spectrum. Line of sight-integrated profiles of the electron and ion temperatures are thus extracted from the Ar XVII spectrum from two distinct spectral line ratios and from the Doppler broadening, respectively. The bremsstrahlung emission and the W line measurements are the two main limitations to compute the electron temperature. Tomographic inversions are also implemented with the library ToFu and used in order to obtain the local electron and ion temperature profiles, which are compared to other measurements from the WEST ECE (electron cyclotron emission) diagnostic. It is shown that both the XICS line-integrated and ECE Te measurements are in better agreement. Systematic differences are shown between the electron temperature profiles calculated from the two available line ratios.