Dielectric breakdown in PLZT 9.5/65/35 ceramics

There is currently a trend to reduce the thickness of the dielectrics and to operate them at higher field levels. Understanding and controlling the breakdown strength will permit higher operating fields. The main goal of this work was to establish the breakdown mechanism in PLZT ceramics. The breakdown experiments were conducted with both hot-pressed and conventional ceramics. The breakdown strength was studied as a function of electrode material, voltage polarity, ramp rate, and temperature. All of the results were consistent with electromechanical breakdown being the dominant mechanism.