绝缘体上的硅
阈值电压
MOSFET
阈下传导
晶体管
材料科学
阈下斜率
泊松方程
电压
光电子学
凝聚态物理
量子
硅
物理
电气工程
量子力学
工程类
作者
J.-P. Colinge,J. Alderman,Weize Xiong,C. Rinn Cleavelin
标识
DOI:10.1109/ted.2006.871872
摘要
A self-consistent Poisson-Schro/spl uml/dinger solver is used to calculate the current in trigate n-channel silicon-on-insulator transistors with sections down to 2 nm /spl times/ 2 nm. The minimum energy of the subbands and the threshold voltage increase as the cross-sectional area of the device is reduced and as the electron concentration in the channel is increased. As a consequence, the threshold voltage is higher than predicted by classical Poisson solvers. The current drive is diminished, and the subthreshold slope is degraded, especially in the devices with the smallest cross sections.
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