Characterization of LiF Using XPS

A commercial LiF powder sample was investigated using x-ray photoelectron spectroscopy. Sample preparation included washing in acetone and methanol, pressing into indium foil and gold decoration for charge correction. Measured binding energies were very similar to those previously reported. [See W. E. Morgan, J. R. Van Wazer, and W. J. Stec, J. Amer. Chem. Soc. 95, 751 (1973); K. Hamrin, G. Johansson, U. Gelius, C. Nordling, and K. Siegbahn, Phys. Scr. 1, 277 (1970); C. D. Wagner, W. M. Riggs, L. E. Davis, J. F. Moulder, and G. E. Muilenberg, Handbook of X-ray Photoelectron Spectroscopy (Physics Electronics Division, Perkin Elmer, Eden Prarie, MN, 1979).] Because F is commonly used as a reference element for tabulated sensitivity factors, data in this paper are useful in evaluating empirical relative sensitivity factors for a specific instrument, in this instance, a Perkin Elmer-Physical Electronics Model 5400 XPS.