Phase shifting algorithms for fringe projection profilometry: A review

The principle of structured light and triangulation is used in a wide range of 3D optical metrology applications, such as mechanical engineering, industrial monitoring, computer vision, and biomedicine. Among a multitude of techniques based on this principle, phase shifting profilometry (PSP) plays a dominant role due to its high attainable measurement accuracy, spatial resolution, and data density. Over the past few decades, many PSP algorithms have been proposed in the literature in order to achieve higher measurement accuracy, lower pattern count, and/or better robustness to different error sources. Besides, many unconventional PSP codification techniques address the problem of absolute phase recovery with few projected patterns, allowing for high-efficiency measurement of objects containing isolated regions or surface discontinuities. In this paper, we present an overview of these state-of-the-art phase shifting algorithms for implementing 3D surface profilometry. Typical error sources in phase measurement for a phase shifting system are discussed, and corresponding solutions are reviewed. The advantages and drawbacks of different PSP algorithms are also summarized to provide a useful guide to the selection of the most appropriate phase shifting technique for a particular application.