热电偶
降级(电信)
可靠性(半导体)
材料科学
加速老化
温度测量
核工程
复合材料
电子工程
热力学
工程类
功率(物理)
物理
作者
Valipi Dinesh Kumar,Anindya Bhattacharyya,R. P. Behera,K. Prabakar
标识
DOI:10.1109/spin57001.2023.10116553
摘要
In sodium cooled fast reactors, thermocouples (TC) play an important role for measuring the temperature. Understanding the anomalous behavior of these sensors, especially the process of degradation as they are subjected to high temperature or corrosive liquids is important in ensuring its long term reliability. In this paper, life estimation of thermocouples, undergoing accelerated aging through induced metauurgical sheath fracture is presented. The results for the parametric degradation of the thermocouples are discussed in detail.
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