FIB-SEM: Emerging Multimodal/Multiscale Characterization Techniques for Advanced Battery Development

The advancement of battery technology necessitates a profound understanding of the physical, chemical, and electrochemical processes at various scales. Focused Ion Beam-Scanning Electron Microscopy (FIB-SEM) has emerged as an indispensable tool for battery research, enabling high-resolution imaging and multiscale analysis from macroscopic structures to nanoscale features at multiple dimensions. This review starts with introducing the fundamentals of focused beam and matter interaction under the framework of FIB-SEM instrumentation and then explores the application of FIB-SEM characterization on rechargeable batteries (lithium-ion batteries and beyond), with a focus on cathode and anode materials, as well as solid-state batteries. Analytical techniques such as Energy Dispersive X-ray Spectroscopy, Electron Backscatter Diffraction, and Secondary Ion Mass Spectrometry are discussed in the context of their ability to provide detailed morphological, crystallographic, and chemical insights. The review also highlights several emerging applications in FIB-SEM including workflow to maintain sample integrity, in-operando characterization, and correlative microscopy. The integration of Artificial Intelligence for enhanced data analysis and predictive modeling, which significantly improves the accuracy and efficiency of material characterization, is also discussed. Through comprehensive multimodal and multiscale analysis, FIB-SEM is poised to significantly advance the understanding and development of high-performance battery materials, paving the way for future innovations in battery technology.