材料科学
三元运算
堆积
过渡金属
叠加断层
扫描透射电子显微镜
结晶学
透射电子显微镜
格子(音乐)
凝聚态物理
分子物理学
位错
纳米技术
核磁共振
复合材料
化学
催化作用
物理
生物化学
程序设计语言
计算机科学
声学
作者
Jun Lu,Sankalp Kota,Michel W. Barsoum,Lars Hultman
标识
DOI:10.1080/21663831.2016.1245682
摘要
We use analytical aberration-corrected high-resolution scanning transmission electron microscopy to image the atomic structure of the layered ternary transition metal (M) borides, Cr2AlB2, Fe2AlB2, and MoAlB. In these ternaries, MB layers and Al single or double atomic layers are interleaved. The atomic positions of the M elements and Al are clearly resolved by Z-contrast images. The following structural defects are also found and described herein: a 90° twist boundary along [010] in Cr2AlB2, a tilt boundary in Fe2AlB2, and Mo2AlB2-like stacking faults in MoAlB, where some of the MB-based structures are intercalated by one (instead of two) Al layer(s).
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