校准
计算机科学
点(几何)
工艺CAD
材料科学
模拟
电子工程
光电子学
计算机辅助设计
物理
工程类
工程制图
几何学
数学
量子力学
作者
Amira Nabil,Ahmed Shaker,Mohamed Abouelatta,Hani Ragai,Christian Gontrand
出处
期刊:Journal of physics
[IOP Publishing]
日期:2020-11-01
卷期号:1710 (1): 012003-012003
被引量:1
标识
DOI:10.1088/1742-6596/1710/1/012003
摘要
Abstract In this paper, a comprehensive comparison of TFET simulations using two TCAD simulators, Sentaurus and Silvaco TCAD, is presented. The comparison is fully cover various types of TFETs, either from the structure geometry or the materials point of view, which proved a framework for TFET designs and simulations. For Sentaurus TCAD, a dynamic nonlocal BTBT model is used for all simulations as it is proved a good calibration for experimental data or full quantum data taken from the literature. The BTBT model’s parameters are determined for different material and hetero-junctions structures where they can be used directly for any design or structure calibration. For the Silvaco simulator, a nonlocal BTBT model is utilized for calibration and its parameters are also provided. The study offers quick parameters data to be used directly, utilizing various materials without being involved in calibration difficulties.
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