原子层沉积
材料科学
纳米技术
图层(电子)
反应性(心理学)
沉积(地质)
原子力显微镜
化学
表面改性
选择性
硅
曲面(拓扑)
作者
Byungchan Lee,Chi Thang Nguyen,Minhyeok Lee,Ngoc Le Trinh,Kyeongmin Min,Youngho Kang,Eun-Hyoung Cho,Han-Bo-Ram Lee
出处
期刊:Materials horizons
[Royal Society of Chemistry]
日期:2026-01-01
卷期号:13 (10): 5035-5049
摘要
. 2D patterns achieved 26.5 nm (200 cycles) of selective deposition, accompanied by an undesirable lateral growth of 18.8 nm. Conversely, 3D patterns achieved 15 nm (100 cycles) of selective growth without lateral growth observation. The critical growth difference is mainly attributed to the surface topology: 3D trench structures provide a more effective physical and chemical barrier compared to 2D structures. Consequently, the results collectively demonstrate the potential of the re-dosing strategy in selectivity improvement and the critical role of topography in achieving reliable AS-ALD for 3D nanofabrication.
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