A floating gate based 3D NAND technology with CMOS under array
作者
Krishna K. Parat,Chuck Dennison
出处
期刊:Technical digest [Institute of Electrical and Electronics Engineers] 日期:2015-12-01卷期号:: 3.3.1-3.3.4被引量:114
标识
DOI:10.1109/iedm.2015.7409618
摘要
NAND Flash has followed Moore's law of scaling for several generations. With the minimum half-pitch going below 20nm, transition to a 3D NAND cell is required to continue the scaling. This paper describes a floating gate based 3D NAND technology with superior cell characteristics relative to 2D NAND, and CMOS under array for high Gb/mm2 density.